1. BS IEC 60747-7:2010. Semiconductor devices – Discrete devices - Part 7: Bipolar transistors

2. BS IEC 60747-8-2010. Semiconductor devices – Discrete devices - Part 8: Field-effect transistors

3. BS IEC 60748-2-20:2008. Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits

4. BS IEC 60748-23-1:2002. Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification

5. BS IEC 60768:2009. Nuclear power plants - Instrumentation important to safety - Equipment for continuous in-line or on-line monitoring of radioactivity in process streams for normal and incident conditions

6. BS IEC 60846-2:2015. Radiation protection instrumentation - Ambient andor directional dose equivalent (rate) meters andor monitors for beta, X and gamma radiation - Part 2

7. BS IEC 60860:2014. Radiation protection instrumentation - Warning equipment for criticality accident

8. BS IEC 60951-1:2009. Nuclear power plants Instrumentation important to safety - Radiation monitoring for accident and post-accident conditions - Part 1

9. BS IEC 60951-2:2009. Nuclear power plants Instrumentation important to safety - Radiation monitoring for accident and post-accident conditions - Part 2

10. BS IEC 60951-3:2009. Nuclear power plants – Instrumentation important to safety – Radiation monitoring for accident and post-accident conditions - Part 3