1. BS IEC 60692:1999. Nuclear instrumentation - Density gauges utilizing ionizing radiation - Definitions and test methods

2. BS IEC 60736:1982. Testing equipment for electrical energy meters

3. BS IEC 60737:2010. Nuclear power plants – Instrumentation important to safety – Temperature sensors (in-core and primary coolant circuit) – Characteristics and test methods

4. BS IEC 60747-1:2006 + A1:2010 Semiconductor devices - Part 1: General

5. BS IEC 60747-14-1:2010. Semiconductor devices - Part 14-1: Semiconductor sensors – Generic specification for sensors

6. BS IEC 60747-14-3:2009. Semiconductor devices - Part 14-3: Semiconductor sensors – Pressure sensors

7. BS IEC 60747-14-4:2011. Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers

8. BS IEC 60747-14-5:2010. Semiconductor devices - Part 14-5: Semiconductor sensors PN-junction semiconductor temperature sensor

9. BS IEC 60747-3:2013. Semiconductor devices - Part 3: Discrete devices Signal, switching and regulator diodes

10. BS IEC 60747-6:2016. Semiconductor devices - Part 6: Discrete devices - Thyristors