1. CEI/IEC 60512-25-3:2001. Connectors for electronic equipment – Tests and measurements – Part 25-3: Test 25c – Rise time degradation

2. CEI/IEC 60512-25-4:2001. Connectors for electronic equipment – Tests and measurements – Part 25-4: Test 25d – Propagation delay

3. CEI/IEC 60512-25-5:2004. Connectors for electronic equipment – Tests and measurements – Part 25-5: Test 25e – Return loss

4. CEI/IEC 60512-25-6:2004. Connectors for electronic equipment – Tests and measurements – Part 25-6: Test 25f Eye pattern and jitter

5. CEI/IEC 60512-25-7:2004. Connectors for electronic equipment – Tests and measurements – Part 25-7: Test 25g – Impedance, reflection coefficient, and voltage standing wave ratio (VSWR)

6. CEI/IEC 60512-6-1:2002. Connectors for electronic equipment – Tests and measurements – Part 6-1: Dynamic stress tests – Test 6a Acceleration, steady state

7. CEI/IEC 60512-6-2:2002. Connectors for electronic equipment – Tests and measurements – Part 6-2: Dynamic stress tests – Test 6b Bump

8. CEI/IEC 60512-6-3:2002. Connectors for electronic equipment – Tests and measurements – Part 6-3: Dynamic stress tests – Test 6c Shock

9. CEI/IEC 60512-6-4:2002. Connectors for electronic equipment – Tests and measurements – Part 6-4: Dynamic stress tests – Test 6d Vibration (sinusoidal)

10. CEI/IEC 60512-6-5:1997. Electromechanical components for electronic equipment – Basic testing procedures and measuring methods – Part 6: Dynamic stress tests – Section 5 Test 6e Random vibratio